DocumentCode :
2090483
Title :
Multiple reflections and improvement of edge scattering in GRECO RCS prediction code
Author :
Rius, Juan M. ; Vall-Ilossera, M. ; Jofre, Lluis
Author_Institution :
Grup A.M.R., Dpt. Teoria del Senyal i Comunicacions, UPC Apdo. 30002, 08080 Barcelona, Tl. +34-3-4017219, Fax +34-3-4017232
fYear :
1993
fDate :
6-10 Sept. 1993
Firstpage :
386
Lastpage :
387
Abstract :
GRECO code for monostatic RCS prediction in real time has been extended by considering multiple reflections between surfaces and improving the edge diffraction coefficients. Multiple reflections are analysed through a very efficient ray-tracing algorithm based on the graphical processing technique. Method of equivalent currents for edge scattering has been improved by Mitzner´s and Michaeli´s incremental length diffraction coefficients (ILDC). This communication presents the general features of GRECO code, in particular the advantages of the new graphical processing technique. Emphasis will be placed in the new features of GRECO still unpublished: the ray-tracing algorithm and the implementation of incremental length diffraction coefficients.
Keywords :
Diffraction; Geometrical optics; Graphics; Hardware; Optical reflection; Optical surface waves; Physical optics; Ray tracing; Scattering; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1993. 23rd European
Conference_Location :
Madrid, Spain
Type :
conf
DOI :
10.1109/EUMA.1993.336901
Filename :
4136630
Link To Document :
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