Title :
Classification and cost estimation of WIP bubbles in a fab
Author :
Hassoun, Michael ; Rabinowitz, Gad ; Lachs, Shlomi
Author_Institution :
Dept. of Ind. Eng. & Manage., Ben-Gurion Univ. of the Negev, Beer-Sheva
Abstract :
The purpose of this article is to define and quantify the bubble phenomenon in a semiconductors fab. A "local bubble" is a relatively acute local and temporal WIP congestion. The local bubble is empirically identified and its impact on the local cycle time distribution is assessed. We then estimate its marginal impact on the overall line cycle time and cost. Finally, a novel visualization of the bubble progression is proposed
Keywords :
costing; integrated circuit manufacture; work in progress; WIP bubbles; bubble progression; cost estimation; cycle time distribution; line cycle time; local bubble; semiconductors fab; work-in-progress congestion; Control charts; Costs; Delay effects; Engineering management; Industrial engineering; Performance loss; Poles and towers; Production; Propagation delay; Visualization;
Conference_Titel :
Semiconductor Manufacturing, 2005. ISSM 2005, IEEE International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-9143-8
DOI :
10.1109/ISSM.2005.1513368
