• DocumentCode
    2092437
  • Title

    Diagnosis of food safety based on pattern discrimination of attenuated total reflectance IR spectrum

  • Author

    Ishizawa, H. ; Nishimatsu, T. ; Toba, E.

  • Author_Institution
    Agricultural Technol. Inst. of Nagano Farmers´´ Fed., Suzaka, Japan
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1524
  • Abstract
    This paper describes a sophisticated diagnosis method of pesticide residues in the agricultural products. The proposed method uses the attenuated total reflectance of infrared light on the sample surface. Lettuces were obtained in the real field as the sample set and were categorised into three groups by the cultivation procedures of tetrachloroisophtharonitrile fungicide application. The categorisation for each sample was verified by chromatography and the results were used as the reference values of residues. Attenuated total reflectance spectrum of each sample lettuce was measured by FTIR spectrometer equipped with a contact sampler. The K-nearest neighbour method and the soft independent modelling of class analogy method have derived two kinds of diagnosis models. These models were verified by using 31 ATR spectra of the validation sample
  • Keywords
    agriculture; attenuated total reflection; infrared spectra; pattern recognition; pollution measurement; principal component analysis; spectrochemical analysis; K-nearest neighbour method; PCA; agricultural products; attenuated total reflectance IR spectrum; calibration; chromatography verification; feature space; food safety diagnosis; lettuces; pattern discrimination; pesticide residues; rapid measurement system; soft independent modelling of class analogy; tetrachloroisophtharonitrile fungicide; Agricultural products; Attenuation measurement; Food technology; Inspection; Product safety; Reflectivity; Spectroscopy; Spraying; Textile technology; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5890-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2000.848727
  • Filename
    848727