DocumentCode :
2092438
Title :
2005 IEEE International Symposium on Electromagnetic Compatibility
Volume :
1
fYear :
2005
fDate :
8-12 Aug. 2005
Abstract :
The following topics were dealt with: EMC management; man-made noise; ultrawideband EMC; EMC measurements; EM interference control; spectrum management; spectrum measurement; high power electromagnetics; computational electromagnetics; reverberation chambers; signal integrity; electromagnetic product safety; and electromagnetic solvers
Keywords :
computational electromagnetics; electromagnetic compatibility; electromagnetic interference; reverberation chambers; EM interference control; EMC management; EMC measurements; computational electromagnetics; electromagnetic product safety; electromagnetic solvers; high power electromagnetics; man-made noise; reverberation chambers; signal integrity; spectrum management; spectrum measurement; ultrawideband EMC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-7803-9380-5
Type :
conf
DOI :
10.1109/ISEMC.2005.1513452
Filename :
1513452
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2092438
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