• DocumentCode
    20925
  • Title

    A Flexible 0.18 \\mu{\\rm m} BiCMOS Technology Suitable for Various Applications

  • Author

    Hashimoto, Toshikazu ; Nonaka, Yosuke ; Tominari, T. ; Fujiwara, Toshihito ; Udo, Tsutomu ; Satoh, H. ; Watanabe, K. ; Jimbo, Toshihiko ; Shimamoto, H. ; Isomura, Satoru

  • Author_Institution
    Micro Device Div., Hitachi Ltd., Tokyo, Japan
  • Volume
    1
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    181
  • Lastpage
    190
  • Abstract
    Hitachi´s SiGe BiCMOS technology, which integrates 0.18 μm CMOS and a SiGe heterojunction bipolar transistor (HBT), does not degrade MOS or bipolar performance. The BiCMOS process is divided into blocks, and the ordering of their processing is optimized so that they do not interfere with each other. Low-thermal-budget SiGe HBT formation is achieved using a minimal-moisture-desorption oxide layer, thereby avoiding disturbing the CMOS process. This technology, which can also be applied to the 0.13 μm generation, has been used for applications ranging from high-speed ones like automotive radar and 40 Gbps optical communication to consumer ones like wireless.
  • Keywords
    BiCMOS integrated circuits; Ge-Si alloys; heterojunction bipolar transistors; optical communication; planarisation; road vehicle radar; BiCMOS technology; SiGe; automotive radar; bit rate 40 Gbit/s; heterojunction bipolar transistor; low-thermal-budget HBT formation; minimal moisture desorption oxide layer; optical communication; size 0.13 mum; size 0.18 mum; BiCMOS integrated circuits; Bipolar transistors; CMOS integrated circuits; CMOS technology; Heterojunction bipolar transistors; Logic gates; Silicon germanium; BiCMOS; Bipolar transistor; SiGe heterojunction bipolar transistor (HBT); hydrogen termination;
  • fLanguage
    English
  • Journal_Title
    Electron Devices Society, IEEE Journal of the
  • Publisher
    ieee
  • ISSN
    2168-6734
  • Type

    jour

  • DOI
    10.1109/JEDS.2013.2294202
  • Filename
    6681899