DocumentCode :
2092816
Title :
Disease progression modeling using Hidden Markov Models
Author :
Sukkar, R. ; Katz, Edward ; Yanwei Zhang ; Raunig, D. ; Wyman, B.T.
Author_Institution :
Voxelon, Inc., Niles, IL, USA
fYear :
2012
fDate :
Aug. 28 2012-Sept. 1 2012
Firstpage :
2845
Lastpage :
2848
Abstract :
The development of novel treatments for many slowly progressing diseases, such as Alzheimer´s disease (AD), is dependent on the ability to monitor and detect changes in disease progression. In some diseases the distinct clinical stages of the disease progress far too slowly to enable a quick evaluation of the efficacy of a given proposed treatment. To help improve the assessment of disease progression, we propose using Hidden Markov Models (HMM´s) to model, in a more granular fashion, disease progression as compared to the clinical stages of the disease. Unlike many other applications of Hidden Markov Models, we train our HMM in an unsupervised way and then evaluate how effective the model is at uncovering underlying statistical patterns in disease progression by considering HMM states as disease stages. In this study, we focus on AD and show that our model, when evaluated on the cross validation data, can identify more granular disease stages than the three currently accepted clinical stages of “Normal”, “MCI” (Mild Cognitive Impairment), and “AD”.
Keywords :
diseases; hidden Markov models; neurophysiology; physiological models; AD stage; Alzheimer disease; MCI stage; disease clinical stages; disease progression assessment; disease progression change detection; disease progression modeling; disease progression monitoring; hidden Markov models; mild cognitive impairment stage; normal stage; slowly progressing diseases; statistical patterns; Alzheimer´s disease; Biological system modeling; Biomarkers; Hidden Markov models; Testing; Training; Alzheimer Disease; Disease Progression; Humans; Markov Chains;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2012.6346556
Filename :
6346556
Link To Document :
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