DocumentCode :
2092855
Title :
Evaluation of parasitic coupling among coupled microstrip line discontinuities using a multiport network modeling approach
Author :
Sabban, Albert ; Gupta, K.C.
Author_Institution :
University of Colorado at Boulder, Boulder, CO 80309-0425, USA; Rafael, P.O.B. 2250 Haifa, Israel
fYear :
1993
fDate :
6-10 Sept. 1993
Firstpage :
656
Lastpage :
658
Abstract :
This paper presents a convenient method for evaluating parasitic coupling caused by coupled microstrip line discontinuities. A Multiport Network Model and a Planar Lumped Model are used to evaluate voltage distributions around the discontinuity edges and along the coupled line section. This voltage distribution is expressed as an equivalent magnetic current distribution which is used to compute the terms of the mutual coupling matrix [Ym] representing the Mutual Coupling Network, MCN. The multiport network modeling approach for evaluation of parasitic coupling among single and coupled microstrip discontinuities is presented in this paper. Results of parasitic coupling caused by coupled microstrip line discontinuities are given in this paper.
Keywords :
Computer networks; Coupling circuits; Current distribution; Dielectrics; Distributed computing; Electromagnetic radiation; Microstrip components; Mutual coupling; Transmission line matrix methods; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1993. 23rd European
Conference_Location :
Madrid, Spain
Type :
conf
DOI :
10.1109/EUMA.1993.336660
Filename :
4136721
Link To Document :
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