DocumentCode :
2095746
Title :
Thermosonic flip-chip bonding using longitudinal ultrasonic vibration
Author :
Tan, Qing ; Zhang, Wenge ; Schaible, Brian ; Bond, Leonard J. ; Ju, T.H. ; Lee, Y.C.
Author_Institution :
Centre for Adv. Manuf. & Packaging of Microwave, Opt., & Digital Electron., Colorado Univ., Boulder, CO, USA
fYear :
1997
fDate :
18-21 May 1997
Firstpage :
1128
Lastpage :
1133
Abstract :
Flip-chip assembly is an important technology for first level electronic packaging. Among different assembly approaches, thermosonic bonding is becoming an attractive choice because it is cost-effective. To increase the bonding capability for high I/O assembly, a novel longitudinal bonding system is developed in this study. This bonding system has two advantages over the transverse bonding system: it overcomes the planarity problem and simplifies bonding tool configuration. During the development, an end-effector is designed with rigorous considerations of ultrasonic wave propagation, bonding force and co-planarity between the chip holder and hot stage. The bonding system is then characterized to make sure that it is suitable for flip-chip assembly. This bonding technology is proven successful by mechanical bonding tests as well as a functional CMOS/SRAM module demonstration. During the bonding process, the chip is under longitudinal ultrasonic “hammering”. However, there is no apparent damage because the impact stress is low due to the low ultrasonic vibration amplitude
Keywords :
flip-chip devices; lead bonding; ultrasonic applications; CMOS/SRAM module; I/O assembly; electronic packaging; end-effector; longitudinal ultrasonic vibration; mechanical testing; thermosonic flip-chip bonding; Assembly systems; Bonding forces; Electronic packaging thermal management; Manufacturing; Microwave technology; Semiconductor device packaging; Soldering; Temperature; Vibrations; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1997. Proceedings., 47th
Conference_Location :
San Jose, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-3857-X
Type :
conf
DOI :
10.1109/ECTC.1997.606313
Filename :
606313
Link To Document :
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