• DocumentCode
    2101765
  • Title

    High performance 4H-SiC emitter coupled logic circuits

  • Author

    Elgabra, Hazem ; Singh, Shakti

  • Author_Institution
    Department of Electrical and Computer Engineering, Khalifa University of Science, Technology and Research, Abu Dhabi, United Arab Emirates
  • fYear
    2013
  • fDate
    8-11 Dec. 2013
  • Firstpage
    104
  • Lastpage
    105
  • Abstract
    The increasing demand for electronic devices and circuits dedicated to harsh environment applications, specifically high temperature and high power, has called for more research dedicated towards silicon carbide (SiC) devices and integrated circuits (ICs). SiC, a wide bandgap semiconductor, is inherently capable of operation in such environments. SiC bipolar transistors unlike MOSFETs, do not have any oxide layer under high electric field, and hence are not prone to reliability issues at high temperatures. In this paper, the design of optimized emitter coupled logic technology circuits using 4H-SiC bipolar transistors is presented. These circuits work over a wide range of temperatures and power supply voltages at high speeds, demonstrating the potential of robust high speed ECL integrated circuits in SiC.
  • Keywords
    Integrated circuit modeling; Logic gates; Noise; Propagation delay; Silicon carbide; Temperature; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits, and Systems (ICECS), 2013 IEEE 20th International Conference on
  • Conference_Location
    Abu Dhabi, United Arab Emirates
  • Type

    conf

  • DOI
    10.1109/ICECS.2013.6815364
  • Filename
    6815364