DocumentCode
2102155
Title
System-chip test strategies
Author
Zorian, Yervant
Author_Institution
LogicVision Inc., San Jose, CA, USA
fYear
1998
fDate
19-19 June 1998
Firstpage
752
Lastpage
757
Abstract
A major challenge in realizing core-based system-chips is the adoption of adequate test and diagnosis strategies. This paper focuses on the current industrial practices in test strategies for system-chips. It discusses the challenges in testing embedded cores, the testing requirements for individual cores, and their test access mechanisms. It also covers the integrated test strategies for system-chips based on reusable cores. In addition to the state-of-the-art practices in testability schemes, this paper covers the current standardization efforts for embedded core test interface mechanisms.
Keywords
integrated circuit testing; microprocessor chips; core-based system-chips; diagnosis strategies; embedded core test interface mechanisms; embedded cores; integrated test strategies; intellectual property test; reusable cores; system-chip test strategies; system-on-chip test; test access mechanisms; Costs; Hardware; Intellectual property; Logic testing; Manufacturing; Permission; Random access memory; Standardization; System testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1998. Proceedings
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-89791-964-5
Type
conf
Filename
724572
Link To Document