• DocumentCode
    2102155
  • Title

    System-chip test strategies

  • Author

    Zorian, Yervant

  • Author_Institution
    LogicVision Inc., San Jose, CA, USA
  • fYear
    1998
  • fDate
    19-19 June 1998
  • Firstpage
    752
  • Lastpage
    757
  • Abstract
    A major challenge in realizing core-based system-chips is the adoption of adequate test and diagnosis strategies. This paper focuses on the current industrial practices in test strategies for system-chips. It discusses the challenges in testing embedded cores, the testing requirements for individual cores, and their test access mechanisms. It also covers the integrated test strategies for system-chips based on reusable cores. In addition to the state-of-the-art practices in testability schemes, this paper covers the current standardization efforts for embedded core test interface mechanisms.
  • Keywords
    integrated circuit testing; microprocessor chips; core-based system-chips; diagnosis strategies; embedded core test interface mechanisms; embedded cores; integrated test strategies; intellectual property test; reusable cores; system-chip test strategies; system-on-chip test; test access mechanisms; Costs; Hardware; Intellectual property; Logic testing; Manufacturing; Permission; Random access memory; Standardization; System testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1998. Proceedings
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-89791-964-5
  • Type

    conf

  • Filename
    724572