DocumentCode :
2102932
Title :
Surface acoustic modes in InSe and GaSe lamellar films
Author :
Panella, V. ; Carlotti, G. ; Socino, G. ; Giovannini, L. ; Eddrief, M. ; Sebenne, C.
Author_Institution :
Dipt. di Fisica, Perugia Univ., Italy
Volume :
1
fYear :
1999
fDate :
17-20 Oct. 1999
Firstpage :
305
Abstract :
Brillouin light scattering has been used for studying surface acoustic mode propagation in InSe and GaSe films epitaxially grown on hydrogen-terminated non-reconstructed Si(111) surface. These films are characterized by strong covalent intra-layer bonds and weak van-der-Waals interlayer interaction. A large anisotropy of the elastic properties is therefore expected. Both Rayleigh and Sezawa guided acoustic modes have been revealed, and their velocity dispersion measured as a function of the ratio between the film thickness and the acoustic wavelength. The data obtained enabled us to determine four of the five elastic constants of the films through a non-linear best fit procedure. In addition, measurement of shear horizontal (Love) modes enabled us to determine the fifth elastic constant C66. The obtained sets of elastic constants show a strong anisotropy with c33 and c44 much lower than c11 and c66, respectively.
Keywords :
Brillouin spectra; III-VI semiconductors; elastic constants; gallium compounds; indium compounds; semiconductor epitaxial layers; semiconductor thin films; surface acoustic waves; Brillouin light scattering; GaSe; H-terminated nonreconstructed Si(111) surface; InSe; Rayleigh modes; Sezawa modes; Si; elastic constants; epitaxial films; film thickness; lamellar films; shear horizontal modes; strong covalent intra-layer bonds; surface acoustic mode propagation; velocity dispersion; weak van-der-Waals interlayer interaction; Acoustic measurements; Acoustic propagation; Acoustic waves; Anisotropic magnetoresistance; Brillouin scattering; Dispersion; Gases; Light scattering; Optical propagation; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
Conference_Location :
Caesars Tahoe, NV
ISSN :
1051-0117
Print_ISBN :
0-7803-5722-1
Type :
conf
DOI :
10.1109/ULTSYM.1999.849407
Filename :
849407
Link To Document :
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