• DocumentCode
    2102995
  • Title

    Influence of bulk wave excitation on performance of impedance elements SAW filters realised on 36/spl deg/ and 42/spl deg/-LiTaO/sub 3/ substrates

  • Author

    Kondratiev, S.N. ; Thorvaldsson, T.

  • Author_Institution
    Temex-SAW, Neuchatel, Switzerland
  • Volume
    1
  • fYear
    1999
  • fDate
    17-20 Oct. 1999
  • Firstpage
    317
  • Abstract
    This paper presents new results of the influence of bulk wave excitation on the performance of impedance elements (IE) SAW filters in the 200-950 MHz frequency range realized on 36° and 42°-LiTaO3 substrates. It was found experimentally, for devices using metal film thickness to wavelength ratio h/λ in the range of 5%-8%, that bulk wave activity on 42°-LiTaO3 substrate is essentially less than that for the 36°-LiTaO3 substrate. Another result of this paper is that the amplitude ripple, rejection and the insertion loss in the bandwidth of IE filters realized on 36° and 42°-LiTaO3 substrates depend on the roughness of the wafer backside, type of glue and thickness of metal film. Three different filters are presented: a low loss filter in the 900 MHz range with 4% relative bandwidth and a measured insertion loss of less than 0.5 dB, a filter at about 450 MHz with 2% relative bandwidth and more than 50 dB level of rejection and finally a filter in the 200 MHz range with a relative bandwidth of about 4% and an insertion loss of 0.7 dB.
  • Keywords
    lithium compounds; surface acoustic wave filters; 200 to 950 MHz; LiTaO3; LiTaO3 substrates; amplitude ripple; backside roughness; bulk wave excitation; impedance elements SAW filters; insertion loss; Acoustic waves; Admittance measurement; Attenuation measurement; Bandwidth; Frequency measurement; Impedance; Insertion loss; SAW filters; Substrates; Surface acoustic waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
  • Conference_Location
    Caesars Tahoe, NV
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-5722-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1999.849410
  • Filename
    849410