Variability mitigation using correction function technique

As the fabrication technology migrates towards nanometer scale; the timing constraints of sequential circuits have become more critical. Process voltage and temperature variations (PVT) increase the unreliability of the sequential circuits. There are different techniques to tolerate the variability and to mitigate the critical timing of the sequential circuits. Traditional techniques using clock skewing or soft-edge flipflop relax the timing conditions by stealing time from adjacent stages. In contrast to traditional techniques using correction function technique can give an indication about the error rate which is useful to re-adjust the supply voltage or the operating frequency. The correction function technique is able to detect the error of one of the 4×4 bit multiplier´s inputs and correct the output data without flushing the pipeline stages with 1.459x overhead of area and 1.427x overhead of power.