DocumentCode
2104685
Title
A single six-port reflectometer measures the scattering parameters of two- port microwave devices
Author
de Oliveira, Antonio Jeronimo Belfort ; Neto, Sergio Pedro Xavier
Author_Institution
Departamento de Eletronica e Sistemas, Centro de Tecnologia, Universidade Federal de Pernambuco, Cidade Universitaria, Recife, Pernambuco, Brasil. Fax: 081-2718215, Email: belfort@npd.ufpe.br
Volume
1
fYear
1995
fDate
4-4 Sept. 1995
Firstpage
357
Lastpage
359
Abstract
A single six-port reflectometer configuration is here proposed to measure the four scattering parameters of two-port microwave devices. In order to determine the transmission coefficients, only one calibration standard and three measurements are required to complete calibration procedure. Furthermore, S12 and S21 can be measured without reversing the device under test.
Keywords
Calibration; Circuits; Isolators; Microwave devices; Microwave measurements; Reflection; Scattering parameters; Switches; Testing; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1995. 25th European
Conference_Location
Bologna, Italy
Type
conf
DOI
10.1109/EUMA.1995.336979
Filename
4137192
Link To Document