2ps electric pulse measurement using scanning tunneling/force optoelectronic microscope

Author

Takeuchi, Koichiro ; Mizuhara, Akira

Author_Institution

Teratec Corp., Tokyo, Japan

Volume

2

fYear

1996

fDate

1996

Firstpage

1506

Abstract

We have developed new measurement systems for ultrafast electric signals using a STM (scanning tunneling microscope) and a SFM (scanning force microscope). A photo-conductive semiconductor switch (PCSS) on the probe is used as a sampler in an optical sampling procedure. We measured electric pulse with 2.5 ps width that corresponds to a time resolution better than 2 ps. This substantial improvement was realized by using low temperature grown GaAs for the PCSS and by decreasing the probe dimension

Keywords

atomic force microscopy; high-speed optical techniques; photoconducting switches; scanning tunnelling microscopy; signal sampling; wave analysers; waveform analysis; 2 ps; GaAs; decreased probe dimension; electric pulse measurement; electro-optic sampling; optical sampling procedure; photoconductive semiconductor switch; pump-probe method; scanning tunneling/force optoelectronic microscope; time resolution; ultrafast electric signals; Electric variables measurement; Force measurement; Microscopy; Optical switches; Probes; Pulse measurements; Sampling methods; Time measurement; Tunneling; Ultrafast optics;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE

Conference_Location

Brussels

Print_ISBN

0-7803-3312-8

Type

conf

DOI

10.1109/IMTC.1996.507621

Filename

507621