• DocumentCode
    2109696
  • Title

    Leakage Power and Side Channel Security of Nanoscale Cryptosystem-on-Chip (CoC)

  • Author

    Zadeh, Amir Khatib ; Gebotys, Catherine

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON
  • fYear
    2009
  • fDate
    13-15 May 2009
  • Firstpage
    31
  • Lastpage
    36
  • Abstract
    This paper investigates the viability of using leakage power consumption as a source of side channel information. The side channel effect is characterized in leakage power. It is shown that the increasing trend of leakage power is highly correlated with security vulnerability of cryptosystems. Addressing the severity of the side channel threat in nanoscale Cryptosystem-on-Chip (CoC), we examine the leakage reduction techniques for the side channel security application. The result shows among the circuit-based reduction techniques high Vth transistor assignment which significantly reduces both average and standard deviation of the leakage power can be exploited as a side channel aware leakage reduction in design and implementation of CoC in submicron era. The findings in this work which are presented for the first time are crucial for the development of side channel resistant cryptosystems in the upcoming CMOS technologies.
  • Keywords
    CMOS integrated circuits; cryptography; system-on-chip; CMOS technologies; circuit-based reduction techniques; leakage power consumption; leakage reduction techniques; nanoscale cryptosystem-on-chip; side channel effect; side channel security; transistor assignment; CMOS technology; Circuits; Computer Society; Cryptography; Energy consumption; Information security; Logic; Nanotechnology; Personal digital assistants; Very large scale integration; Cryptosystem-on-Chip (CoC); Leakage power; side channel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI, 2009. ISVLSI '09. IEEE Computer Society Annual Symposium on
  • Conference_Location
    Tampa, FL
  • Print_ISBN
    978-1-4244-4408-3
  • Electronic_ISBN
    978-0-7695-3684-2
  • Type

    conf

  • DOI
    10.1109/ISVLSI.2009.46
  • Filename
    5076379