Title :
Measurement-based large-signal simulation of active components from automated nonlinear vector network analyzer data via X-parameters
Author :
Horn, Jason ; Gunyan, Daniel ; Betts, Loren ; Gillease, Chad ; Verspecht, Jan ; Root, David E.
Author_Institution :
Agilent Technol., Santa Rosa, CA
Abstract :
Predictable measurement-based large-signal design has been demonstrated with a unique set of interoperable commercially available nonlinear technologies for measurement, simulation, and design of nonlinear components. The new NVNA instrument, automated X-parameter measurements and extraction, and auto-configurable compiled PHD component in ADS, together enable design of nonlinear circuits entirely from fully calibrated nonlinear component data.
Keywords :
network analysers; nonlinear network analysis; active component; automated X-parameter measurement; automated nonlinear vector network analyzer data; calibrated nonlinear component data; measurement-based large signal design; measurement-based large signal simulation; nonlinear circuit; nonlinear technology; Analytical models; Data analysis; Data mining; Electronic mail; Frequency; Harmonic distortion; Intermodulation distortion; Phase distortion; Scattering parameters; Vectors;
Conference_Titel :
Microwaves, Communications, Antennas and Electronic Systems, 2008. COMCAS 2008. IEEE International Conference on
Conference_Location :
Tel-Aviv
Print_ISBN :
978-1-4244-2097-1
Electronic_ISBN :
978-1-4244-2098-8
DOI :
10.1109/COMCAS.2008.4562819
