Title :
Basic VHDL tests conforming to IEC 61508
Author :
Hayek, Ali ; Schreiber, Michael ; Börcsök, Josef
Author_Institution :
Comput. Archit. & Syst. Programming, Univ. of Kassel, Kassel, Germany
Abstract :
The development of embedded sensing applications based on integrated circuits leads to ever-growing complexity of VHDL-code and requires sophisticated testability to achieve high diagnostic coverage. The norm IEC 61508 provides a set of requirements for the implementation of safety-related software. This paper deals with the testing of VHDL modules according to IEC 61508. Since VHDL is a hardware description language and differs from traditional software languages, new testing aspects and common coverage criteria are examined with respect to basic needs resulting from those differences. Therefore, a development process according to the V-Model is introduced and a classification of VHDL modules is proposed, providing a basis on which several testing methods and exit-criteria can be evaluated with respect to specific design attributes common for each class.
Keywords :
IEC standards; conformance testing; embedded systems; formal verification; hardware description languages; program testing; IEC 61508; VHDL test conforming; design attribute; diagnostic requirement; safety related software; Delay; Educational institutions; Logic gates; Oscillators; Testing; Functional Safety; Tests; VHDL;
Conference_Titel :
Networked Sensing Systems (INSS), 2010 Seventh International Conference on
Conference_Location :
Kassel
Print_ISBN :
978-1-4244-7911-5
Electronic_ISBN :
978-1-4244-7910-8
DOI :
10.1109/INSS.2010.5573616