Title :
Probabilistic and Monte Carlo risk models for carbon nanomaterial production processes
Author :
Ok, Zeynep D. ; Isaacs, Jacqueline A. ; Benneyan, James C.
Author_Institution :
Mech. & Ind. Eng. Dept., Northeastern Univ., Boston, MA
Abstract :
Given considerable uncertainty surrounding the occupational, consumer, and environmental, health and safety (EHS) risks of various nanomaterial manufacturing processes, modeling their relative risks and benefits is especially important. This paper discusses possible risk assessment methods that might be useful in such applications and explores three probabilistic approaches in greater detail: Monte Carlo (MC) simulation models, Bayesian belief networks, and multi-criteria decision trees. These approaches are illustrated for single wall carbon nanotubes (SWNT) produced via high pressure carbon monoxide (HiPco) processes to study the impact of inherent uncertainties and early EHS standards decisions on predicting long-term manufacturing costs, occupational health (OH) exposure risks, and associated tradeoffs. Until research progresses on the EHS risks of nanomaterials, these types of analyses can provide useful information for private and regulatory decision-makers and for guiding research priorities.
Keywords :
Monte Carlo methods; belief networks; carbon nanotubes; decision making; decision trees; nanostructured materials; nanotechnology; occupational health; occupational safety; risk management; Bayesian belief networks; Monte Carlo risk models; carbon nanomaterial production process; decision making; environmental risk; high pressure carbon monoxide; manufacturing costs; multicriteria decision trees; occupational health exposure risks; probabilistic risk models; risk assessment; safety risk; single wall carbon nanotubes; Bayesian methods; Carbon nanotubes; Costs; Decision trees; Health and safety; Manufacturing processes; Monte Carlo methods; Production; Risk management; Uncertainty; HiPco; SWNT; occupational health risk; uncertainty;
Conference_Titel :
Electronics and the Environment, 2008. ISEE 2008. IEEE International Symposium on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-2272-2
Electronic_ISBN :
978-1-4244-2298-2
DOI :
10.1109/ISEE.2008.4562944