Title :
The study of Pairwise Condition Covering test technology
Author :
Zhu, Shi ; Ding, Qing ; Jiang, Ming
Author_Institution :
School of Software Engineering, University of Science and Technology of China, Hefei China
Abstract :
Multiple Condition Coverage (MCC) is a very strong test criterion in the white-box test, but as it requires much more test cases, it is not useful in practices. We now propose a new method: Pairwise Condition Covering test, which simplified MCC, but inherited the advantage of MCC, meanwhile it needs only a few numbers of test cases. Compare to the widely used Modified Condition/Decision Coverage (MC/DC), it will use less test cases when there are quite a lot of conditions; besides it can discover the deficiencies which MC / DC could not identify.
Keywords :
Arrays; Computers; Educational institutions; Programming; Software; Software engineering; Testing; Modified Condition/Decision Coverage; Multiple Condition Coverage; Pairwise Condition Coverage;
Conference_Titel :
Information Science and Engineering (ICISE), 2010 2nd International Conference on
Conference_Location :
Hangzhou, China
Print_ISBN :
978-1-4244-7616-9
DOI :
10.1109/ICISE.2010.5689928
