• DocumentCode
    2115349
  • Title

    Solder Joint Loading Conditions under Torsion Test

  • Author

    Maia Filho, W.C. ; Brizoux, Michel ; Fremont, Helene ; Danto, Yves

  • Author_Institution
    THALES Res. & Technol., Orsay
  • fYear
    2006
  • fDate
    24-26 April 2006
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    More than 10 years ago a so-called mechanical deflection system (MDS) for highly accelerated tests has been developed in order to evaluate the solder joints reliability. The objective was to replace long accelerated thermal cycling (ATC) tests by shorter mechanical ones. This promising concept has not been recognized as an industrial standard test method because of the misunderstanding of solder joint loading conditions. In the field, fatigue failures of solder joints are principally induced by shear stress as a consequence of relative displacement between package and board solder pads. Indeed, any accelerated test should take it into account. Based on this fact, this work is focused on the understanding of stress distribution and on the definition of torsion test conditions to ensure the fact that the solder joints are stressed in shear mode. Three main actions, finite element analysis, dedicated test program and strain gage measurements, have been conducted in parallel to guaranty consistency of data results and model calibration. Firstly, on the board we observed shear strains as the main behaviour and important edge effects for low and high torsion angles values. An area of homogeneous strain was identified: finite element analysis (FEA) and strain measurements were in good agreement. Secondly, on the boards equipped with BGA (ball grid array) package, we analyzed the stress distribution in solder joints. Experimental torsion tests and cross section analyses were made to identify the failure mode. Components placed in the homogeneous strain area showed equivalent failure mode and the observed cracks confirmed the shear stress as fatigue mechanism
  • Keywords
    ball grid arrays; finite element analysis; mechanical strength; reliability; soldering; strain measurement; thermal stress cracking; torsion; ATC; BGA; MDS; accelerated thermal cycling; ball grid array package; board solder pads; fatigue failures; fatigue mechanism; finite element analysis; mechanical deflection system; solder joint loading conditions; solder joints reliability; strain gage measurements; stress distribution; torsion test; Calibration; Capacitive sensors; Fatigue; Finite element methods; Life estimation; Packaging; Soldering; Strain measurement; System testing; Thermal stresses; BGA solder joints; Finite element analysis; Strain gages; Test methodology; Torsion test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on
  • Conference_Location
    Como
  • Print_ISBN
    1-4244-0275-1
  • Type

    conf

  • DOI
    10.1109/ESIME.2006.1644009
  • Filename
    1644009