DocumentCode :
2116625
Title :
Effects Of Physical Models On Bipolar AC Characteristics
Author :
Shigyo, Naoyuki ; Niitsu, Youichirou
Author_Institution :
Toshiba Corporation
fYear :
1993
fDate :
14-15 May 1993
Firstpage :
114
Lastpage :
115
Keywords :
Bipolar transistors; Current measurement; Current-voltage characteristics; Cutoff frequency; Frequency measurement; Impurities; Integrated circuit modeling; Photonic band gap; Solid modeling; Ultra large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
Print_ISBN :
0-7803-1338-0
Type :
conf
DOI :
10.1109/VPAD.1993.724746
Filename :
724746
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2116625
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