• DocumentCode
    2117111
  • Title

    Novel silicon-embedded coreless coupled inductors for high efficiency on-chip dc-dc conversion

  • Author

    Wu, Rongxiang ; Sin, Johnny K O

  • Author_Institution
    Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
  • fYear
    2011
  • fDate
    17-22 Sept. 2011
  • Firstpage
    1827
  • Lastpage
    1831
  • Abstract
    In this paper, novel silicon-embedded coreless coupled inductors are proposed and demonstrated for high efficiency on-chip dc-dc conversion. Two interleaved thick inductor coils are embedded in the bottom layer of the Si substrate, providing small dc resistances; while only 4 vias are opened in the top substrate layer, leaving most of the top substrate surface for other converter components. The 0.5 mm2 coupled inductors fabricated show coil dc resistance of 0.11 Ω, coil ac resistance of 0.44 Ω, and coil ac inductance of 3.2 nH at 170 MHz with a coupling factor of 0.73 and a mutual resistance of 0.30 Ω. For 1.2 V to 0.9 V, 0.19 A, 170 MHz on-chip dc-dc conversion, a high efficiency of 94% is achieved by the silicon-embedded coreless coupled inductors, leading to a converter loss reduction of 44% and a converter efficiency increase from 78% to 86% compared to the prior art.
  • Keywords
    DC-DC power convertors; coils; elemental semiconductors; inductors; silicon; Si; coil AC inductance; coil AC resistance; coil DC resistance; converter efficiency; converter loss reduction; current 0.19 A; efficiency 78 percent to 86 percent; efficiency 94 percent; frequency 170 MHz; high efficiency on-chip DC-DC conversion; interleaved thick inductor coil; mutual resistance; resistance 0.11 ohm; resistance 0.30 ohm; resistance 0.44 ohm; silicon-embedded coreless coupled inductor; top substrate layer; voltage 1.2 V to 0.9 V; Coils; Copper; Electrical resistance measurement; Inductors; Resistance; Substrates; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Congress and Exposition (ECCE), 2011 IEEE
  • Conference_Location
    Phoenix, AZ
  • Print_ISBN
    978-1-4577-0542-7
  • Type

    conf

  • DOI
    10.1109/ECCE.2011.6064007
  • Filename
    6064007