Title :
Effective Dielectric Permittivity of r-Cut Sapphire Microstrip
Author :
Vendik, I.B. ; Vendik, O.G. ; Gevorgian, S.S.
Author_Institution :
Electrotechnical University, St.-Petersburg, 197376, Russia
Abstract :
The effective dielectric constant of a microstrip is given as a function of the strip geometry and its orientation on the surface of the substrate. An "isotropized" dielectric constant is inroduced which can be used in commercial microwave software for simulation of r-cut sapphire substrate based micrstrip devices. Experimental velification of the analysis is also given.
Keywords :
Dielectric constant; Dielectric losses; Dielectric substrates; Microstrip components; Permittivity; Strips; Superconducting microwave devices; Tensile stress; Thermal conductivity; Yttrium barium copper oxide;
Conference_Titel :
Microwave Conference, 1994. 24th European
Conference_Location :
Cannes, France
DOI :
10.1109/EUMA.1994.337241
