Title :
Target Recognition Based on a Novel Riemannian Map
Author :
Li, Guangwei ; Liu, Yunpeng ; Shi, Zelin ; Yin, Jian
Author_Institution :
Opt.-Electron. Inf. Lab., CAS, Shenyang, China
Abstract :
The geometric warps of a rigid planar object can be represented by a projective Lie group The Riemannian map and its inverse map play an important role in designing an efficient algorithm to compute the Riemannian mean on special linear group. This mean is the key to constructing the Lie group normal distribution which is an important prior when using the Bayes statistical reference rule in the planar target recognition. In order to solve the problem that the inverse map of Riemannian map on special linear map based on Cartan decomposition has not a closed formula, we define a new Riemannian map and get its inverse map in terms of the polar decomposition theorem. Then we propose a stable algorithm to compute the mean on special linear group and give a simple target recognition experiment to show that it is helpful to improve success recognition rate if utilizing the transformation group prior.
Keywords :
Bayes methods; Lie groups; geometry; image recognition; normal distribution; object recognition; Bayes statistical reference rule; Cartan decomposition; Riemannian map; geometric warp; group normal distribution; inverse map; object recognition; planar target recognition; polar decomposition theorem; projective Lie group; special linear group; stable algorithm; Cameras; Content addressable storage; Design automation; Gaussian distribution; Geometrical optics; Laboratories; Project management; Research and development management; Shape; Target recognition;
Conference_Titel :
Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
Conference_Location :
Tianjin
Print_ISBN :
978-1-4244-4129-7
Electronic_ISBN :
978-1-4244-4131-0
DOI :
10.1109/CISP.2009.5302789