Title :
Measuring in-plane operational deflection shapes at ultra-high frequencies
Author :
Ur-Rehman, F. ; Rembe, Christian
Author_Institution :
R&D, Polytec GmbH, Waldbronn, Germany
Abstract :
This paper reports the proof of concept of a novel sensor technique to measure the in-plane, contour modes of Radio Frequency Micro-Electro-Mechanical (RF-MEM) resonators at frequencies above 100 MHz with accurate vibration amplitudes. We have achieved this goal for the first time to our knowledge and we demonstrate our first measurement. RF-MEM resonators are designed to perform mainly an in-plane vibration and, thus, it is substantially for the designer to get an experimental feedback of the in-plane contour modes. In order to accomplish accurate in-plane-vibration measurements we have combined heterodyne interferometry, scanning vibrometry, amplitude demodulation, and optical flow. The results presented in this paper allow, for the first time, the analysis of the in-plane vibration behavior of MEM resonators.
Keywords :
amplitude modulation; image sequences; micromechanical resonators; microsensors; vibration measurement; RF-MEM resonator; heterodyne interferometry; in-plane operational deflection shape; optical flow; radio frequency micro-electro-mechanical resonator; scanning vibrometry; sensor technique; ultra-high frequency; vibration amplitude demodulation;
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2010.5690133