DocumentCode :
2122577
Title :
Comparison of the surface properties of power electronic substrates
Author :
Hromadka, Karel ; Reboun, Jan ; Rendl, Karel ; Wirth, Vaclav ; Hamacek, Ales
Author_Institution :
Department of Technologies and Measurement/RICE, University of West Bohemia, Pilsen, Czech Republic
fYear :
2015
fDate :
6-10 May 2015
Firstpage :
146
Lastpage :
150
Abstract :
This paper deals with thick film copper technology (TFC) and its comparison with other power electronic substrates such as a printed silver or direct bonded copper (DBC) on alumina substrates. The research activities were concentrated on surface properties of power substrates and its solderability. The solderability of thick film copper is comparable with other power electronic substrates such as DBC, but it is necessary to ensure proper firing condition or remove oxides from the surface after firing and use a proper flux. The main advantages of thick film copper in comparison with common power electronic substrates are a high resolution of conductive pattern, higher reliability at thermal cycling and a possibility to create a different local thickness of copper layer on substrate. Maximal thickness of copper layer can reach 300 µm.
Keywords :
Copper; Furnaces; Rough surfaces; Substrates; Surface morphology; Surface roughness; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology (ISSE), 2015 38th International Spring Seminar on
Conference_Location :
Eger, Hungary
Type :
conf
DOI :
10.1109/ISSE.2015.7247979
Filename :
7247979
Link To Document :
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