Title :
An efficient yield optimization method using a two step linear approximation of circuit performance
Author :
Wang, Zhihua ; Director, S.W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
28 Feb-3 Mar 1994
Abstract :
A novel method for the estimation of yield of integrated circuits based on a two step linear approximation of circuit performance is proposed. By using this method, only one complete circuit simulation is needed for the estimation of yield. A new algorithm for yield optimization is also presented. It is based on the random direction stochastic approximation and does not require the evaluation of yield gradients. Examples are given to demonstrate the efficiency of the algorithm
Keywords :
Monte Carlo methods; VLSI; circuit analysis computing; differential amplifiers; linear integrated circuits; operational amplifiers; optimisation; Monte Carlo analysis; VLSI circuit; algorithm; bipolar differential amplifier; circuit simulation; integrated circuit yield; linear transconductance amplifier; parametric yield; random direction stochastic approximation; two step linear approximation; yield optimization method; Circuit optimization; Design optimization; Equations; Gravity; Integrated circuit yield; Linear approximation; Optimization methods; Very large scale integration; Voltage; Yield estimation;
Conference_Titel :
European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-5410-4
DOI :
10.1109/EDTC.1994.326817
