DocumentCode
2127183
Title
Uncertainty analysis of a DVM-based quantum Hall measurement set-up
Author
Rietveld, C. ; Van Mullem, C.J.
Author_Institution
NMi Van Swinden Lab., Delft, Netherlands
fYear
2000
fDate
14-19 May 2000
Firstpage
90
Lastpage
91
Abstract
A detailed uncertainty analysis is presented of a quantum Hall measurement set-up based on a digital voltmeter (DVM) that has been developed at the NMi Van Swinden Laboratorium. Special attention is paid to the uncertainty contributions that arise from the DVMs being used.
Keywords
Digital voltmeters; Electric resistance measurement; Measurement standards; Measurement uncertainty; Quantum Hall effect; DVM-based setup; linear DVM; quantum Hall measurement setup; resistance measurement; resistance standards comparison; uncertainty analysis; Current measurement; Electrical resistance measurement; Hall effect; Instruments; Laboratories; Measurement standards; Relays; Resistors; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location
Sydney, NSW, Australia
Print_ISBN
0-7803-5744-2
Type
conf
DOI
10.1109/CPEM.2000.850891
Filename
850891
Link To Document