Title :
Bulk and edge phenomena in AC quantum Hall effect?
Author :
Schurr, J. ; Melcher, J. ; von Campenhausen, A. ; Pierz, K. ; Hein, G. ; Ahlers, F.-J.
Author_Institution :
Phys. Tech. Bundesanstalt, Braunschweig, Germany
Abstract :
We investigated the AC quantum Hall effect of several GaAs-based samples. The influence of temperature, current, and frequency was measured and seems to be caused by bulk and edge phenomena.
Keywords :
Bridge circuits; Electric resistance measurement; Gallium arsenide; Measurement standards; Quantum Hall effect; AC quantum Hall effect; GaAs; GaAs-based samples; bulk phenomena; coaxial bridge; current influence; edge phenomena; frequency influence; resistance measurement; temperature influence; Bridge circuits; Current measurement; Electrical resistance measurement; Frequency; Hall effect; Impedance; Resistors; Shape measurement; Temperature; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.850924
