Title :
Intercomparison of resistance standards with calculable frequency dependence for the characterisation of quantum Hall devices
Author :
Melcher, J. ; Bohacek, J. ; Riha, J. ; Von Campenhausen, A. ; Pesel, E.
Author_Institution :
Phys. Tech. Bundesanstalt, Braunschweig, Germany
Abstract :
We have constructed AC/DC transfer resistance standards with nominal values of 12906.4 /spl Omega/. The design of these resistors follows Gibbings principles [1963]. The resistors differ considerably since bifilar, quadrifilar, and octafilar units have been built. In addition the length of the quadrifilar units was varied.
Keywords :
Electric resistance measurement; Measurement uncertainty; Quantum Hall effect; Resistors; Transfer standards; 12906.4 ohm; 400 Hz to 5 kHz; AC-DC transfer standards; bifilar units; calculable frequency dependence; loop elements; octafilar units; quadrifilar units; quantum Hall devices characterisation; relative deviation; resistance standards intercomparison; uncertainty; Copper; Electrical resistance measurement; Frequency dependence; Impedance; Insulation; Petroleum; Resistors; Thermal resistance; Uncertainty; Wire;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.850933
