DocumentCode :
2128931
Title :
Hexagonal boron nitride for deep UV photonics
Author :
Jiang, Hongxing ; Lin, Jingyu
Author_Institution :
Department of Electrical and Computer Engineering, Texas Tech University, Lubbock, TX 79409
fYear :
2015
fDate :
13-15 July 2015
Firstpage :
133
Lastpage :
134
Abstract :
Hexagonal boron nitride (h-BN) possesses extraordinary physical properties including wide bandgap (Eg ∼ 6.5 eV), high temperature stability and corrosion resistance, and large optical absorption and emission, and thermal neutron capture cross section. In addition, h-BN is a material with a very low dielectric constant, but having a very high dielectric strength. Due to its similar lattice constant with graphene, h-BN is an ideal template and dielectric separation layer in graphene devices. Furthermore, having a hexagonal layered-structure, h-BN represents an ideal platform for probing fundamental 2D properties in semiconductors. In comparison to AlN, p-type h-BN appears to be easier to obtain [1–3]. Currently, the most outstanding issue for achieving high performance deep UV emitters based on III-nitrides is the low p-type conductivity of Al-rich AlGaN. This issue is caused by the large acceptor activation energies (EA) in Al-rich AlxGa1−xN (as large as 500 meV in AlN) [3–6]. The attainment of p-type h-BN could potentially overcome the intrinsic problem of low p-type conductivity in Al-rich AlGaN for deep UV photonic devices. Wafer-scale h-BN epilayers (up to 2-inch in diameter) have been successfully synthesized by MOCVD [1–3, 7–9].
Keywords :
Aluminum gallium nitride; Aluminum nitride; Conductivity; III-V semiconductor materials; MOCVD; Wide band gap semiconductors; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Summer Topicals Meeting Series (SUM), 2015
Conference_Location :
Nassau, Bahamas
Print_ISBN :
978-1-4799-7467-2
Type :
conf
DOI :
10.1109/PHOSST.2015.7248231
Filename :
7248231
Link To Document :
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