• DocumentCode
    2129193
  • Title

    Comparing Reliability of Association Rules and OLAP Statistical Tests

  • Author

    Chen, Zhibo ; Ordonez, Carlos ; Zhao, Kai

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Houston, Houston, TX
  • fYear
    2008
  • fDate
    15-19 Dec. 2008
  • Firstpage
    8
  • Lastpage
    17
  • Abstract
    Association rules is a technique that can detect patterns within the items of a dataset. The constrained version applies several restrictions that reduces the number of rules and also helps improve performance. On the other hand, OLAP statistical tests is an integration of exploratory On-Line Analytical Processing techniques and statistical tests. It uses a different approach that make it more appropriate for continuous domains and is able to discover more informative patterns. In this article, we thoroughly compare the reliability of the results returned by both techniques by analyzing the metrics, such as confidence and p-value, by which these techniques are implemented in relation to the results that are generated. While these two techniques are different, we were able to bring both to level ground by extending association rules with pairing to discover more specific patterns and extending OLAP statistical tests with constraints to reduce the number of discovered patterns. We conducted our experiments on a real medical dataset and found that the extended OLAP statistical tests discovered more patterns, had comparable performance, and possessed higher reliability due to its strong statistical background.
  • Keywords
    data mining; statistics; OLAP statistical tests; association rules; online analytical processing techniques; Association rules; Computer science; Conferences; Data mining; Diseases; Itemsets; Medical tests; Pattern analysis; Predictive models; Testing; Association Rules; Data Mining; Database; OLAP;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Mining Workshops, 2008. ICDMW '08. IEEE International Conference on
  • Conference_Location
    Pisa
  • Print_ISBN
    978-0-7695-3503-6
  • Electronic_ISBN
    978-0-7695-3503-6
  • Type

    conf

  • DOI
    10.1109/ICDMW.2008.76
  • Filename
    4733916