• DocumentCode
    2129353
  • Title

    Fault tolerance analysis of odd-even transposition sorting networks with single pass and multiple passes

  • Author

    Salloum, Salam N. ; Wang, Der-Haw

  • Author_Institution
    California State Polytech. Univ., Pomona, CA, USA
  • Volume
    1
  • fYear
    2003
  • fDate
    28-30 Aug. 2003
  • Firstpage
    193
  • Abstract
    The odd-even transposition sorting networks have a simple and reliable VLSI implementation, and also have good fault tolerance properties. In this paper, a formal proof is presented for a well-known conjecture that states the odd-even transposition sorting networks are one-fault tolerant with respect to stuck-at-X fault at any internal comparators. Also, new simulation results are reported for a new mode of operation, sorting via multiple passes through the networks. Under this mode, the simulation results reveal that the odd-even transposition networks are k-fault tolerant with respect to stuck-at-X, stuck-at-H, and stuck-at-T at any set of internal comparators.
  • Keywords
    VLSI; fault tolerant computing; sorting; Fault tolerance analysis; VLSI implementation; fault tolerance properties; internal comparators; k-fault tolerant; multiple passes; odd-even transposition sorting networks; single pass; stuck-at-X fault; Application software; Asynchronous transfer mode; Database machines; Electronic mail; Fault diagnosis; Fault tolerance; Hardware; Optical computing; Parallel machines; Sorting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, Computers and signal Processing, 2003. PACRIM. 2003 IEEE Pacific Rim Conference on
  • Print_ISBN
    0-7803-7978-0
  • Type

    conf

  • DOI
    10.1109/PACRIM.2003.1235750
  • Filename
    1235750