Title :
A capacitance standard based on counting electrons
Author :
Keller, M.W. ; Zimmerman, N.M. ; Eichenberger, A.L. ; Martinis, J.M.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We have built a prototype capacitance standard based on single-electron tunneling (SET) devices and cryogenic vacuum-gap capacitor. We are currently involved in a thorough uncertainty analysis of the prototype, and we are preparing to make a direct comparison with the calculable capacitor at NIST.
Keywords :
bridge circuits; capacitance measurement; capacitors; electrometers; measurement standards; measurement uncertainty; quantum interference devices; Josephson constant; SET electrometer; calculable capacitor comparison; counting electrons; cryogenic vacuum-gap capacitor; prototype capacitance standard; single-electron tunneling devices; uncertainty analysis; Bridge circuits; Capacitance measurement; Capacitors; Cryogenics; Electrons; Measurement standards; NIST; Prototypes; Uncertainty; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851004
