Title :
CMOS compatible planar integration of compact semiconductor laser diodes with waveguides on silicon
Author :
Famenini, Shaya ; Fonstad, Clifton G.
Author_Institution :
Massachusetts Inst. of Technol., Cambridge, MA, USA
Abstract :
We report planar, coaxial integration of edge-emitting InGaAs/InP laser diodes with silicon oxy-nitride (SiON) waveguides on silicon substrates using a modular recess-integration technique compatible with integration on full CMOS wafers after conventional front- and back-end processing has been completed [1]. The technique results in a small device footprint and can be used to integrate multiple types of devices on a single wafer. We feel it is superior to other optoelectronic integration techniques; more broadly, it is ideally suited to realizing robust, planar, monolithically integrated micro-systems incorporating a variety of materials and devices.
Keywords :
CMOS integrated circuits; III-V semiconductors; gallium compounds; indium compounds; semiconductor lasers; waveguide lasers; CMOS wafers; CMOS-compatible planar-coaxial integration; InGaAs-InP; Si; back-end processing; compact-edge-emitting semiconductor laser diodes; front-end processing; modular recess-integration technique; monolithically-integrated microsystems; optoelectronic integration technique; silicon oxy-nitride waveguides; silicon substrates; Diode lasers; Laser theory; Measurement by laser beam; Optical waveguides; Silicon; Substrates; Waveguide lasers;
Conference_Titel :
Semiconductor Laser Conference (ISLC), 2012 23rd IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4577-0828-2
DOI :
10.1109/ISLC.2012.6348197