Title :
A Novel Extraction Method for Temperature Dependent Large Signal Equivalent Circuit Model of HBT
Author :
Suh, Young-Suk ; Roh, Tai Moon ; Kim, Youngsik ; Shin, Jinho ; Kim, Bumman
Author_Institution :
Dept. of Electronics Eng., Yeungnam University, Kyong-San, Kyong-Buk, 712-749, South Korea.
Abstract :
A new equivalent circuit parameter extraction method for HBT is proposed. An accurate analytical expression for thermal capacitance (Cth) is derived. This equation shows the previous expression for Cth is deprived. This equation shows the previous expression for Cth is erroneous. And a direct extraction scheme for the current source model parameter, without any trimming process, is proposed. This scheme uses the Gummel-plot in which the thermal effect and voltage drop in parasitic resistance are removed.
Keywords :
Capacitance; Current measurement; Equations; Equivalent circuits; Heterojunction bipolar transistors; Parameter extraction; Temperature dependence; Thermal degradation; Thermal resistance; Voltage;
Conference_Titel :
Microwave Conference, 1997. 27th European
Conference_Location :
Jerusalem, Israel
DOI :
10.1109/EUMA.1997.337777
