Title :
Detection of Asian dust using KOMPSAT/OSMI dataInSAR
Author :
Suh, Ae-Sook ; Kim, Mi-Hyang ; Choi, Chul-Uong
Author_Institution :
Remote Sensing Res. Lab., Meteorol. Res. Inst., Seoul, South Korea
Abstract :
Korea has been influenced by Asian dust since January 2001. This Asian dust not only causes low visibility but also is harmful to human health. Monitoring of Asian dust by satellite detection is most important for long range transportation and wide area detection. We derived an algorithm for Asian dust detection using Korean Multi-Purpose SATellite/Ocean Scanning Multispectral Imager (KOMPSAT/OSMI). To obtain the best wavelength band of the 6 spectral bands of OSMI for detection of Asian dust, the data was executed regional and spectrum analysis. We also compared spectral characteristics of OSMI with that of SeaWiFS has the same wavelength range. The result showed that band 5 (765 nm) and 6 (865 nm) of OSMI had the best spectral distribution. Therefore, only two. bands were applied to the algorithm for Asian dust detection. In a case study, Asian dust could be detected on April 13, 2001 from the algorithm. The dust had appeared over the Southern part of Korea Including Jeju island and showed the aerosol optical depth in the range of 0∼0.8 in OSMI´s band 6, especially 0.5 near Jeju island. Also we compared it with that of MODerate resolution Imaging Spectroradiometer (MODIS) Level 2 products. According to result that compare, the distribution of Asian dust is similar.
Keywords :
atmospheric composition; atmospheric techniques; dust; remote sensing; 400 to 885 nm; AD 2001 04 13; Asia; Asian dust; IR; KOMPSAT; Korea; OSMI; airborne dust; algorithm; atmosphere; detection; infrared; measurement technique; satellite remote sensing; spectral characteristics; spectral distribution; visible; Aerosols; Atmospheric measurements; Biomedical optical imaging; Color; MODIS; Oceans; Optical sensors; Remote monitoring; Satellites; Sea measurements;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2002. IGARSS '02. 2002 IEEE International
Print_ISBN :
0-7803-7536-X
DOI :
10.1109/IGARSS.2002.1026835