Title :
Complete characterization of Zener standards at 10 V for measurement assurance program (MAP)
Author :
Tang, Y.H. ; Sims, J.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
A complete characterization of Zener standards for temperature, pressure, and humidity is being performed to improve the uncertainty of a MAP that uses 10 V Zeners as travelling standards. The procedure and equipment used for this work are briefly described. We will report results of evaluating our available pool of Zener standards.
Keywords :
Zener diodes; atmospheric humidity; atmospheric pressure; calibration; measurement uncertainty; thermal stability; transfer standards; voltage measurement; 10 V; 10 V Zeners; Measurement Assurance Program; Zener standards; dc voltage standard; drift; humidity effect; measurement uncertainty; noise; pressure effect; temperature effect; travelling standards; Calibration; Humidity measurement; Laboratories; Measurement standards; NIST; Pressure measurement; Temperature; Uncertainty; Voltage; Working environment noise;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.851189
