Title :
Detecting the motion of a microresonator via mode-mode interaction
Author :
Westra, H.J.R. ; Poot, M. ; van der Zant, H.S.J. ; Venstra, W.J.
Author_Institution :
Kavli Inst. of Nanosci., Delft Univ. of Technol., Delft, Netherlands
Abstract :
We demonstrate that a flexural resonance mode of a clamped-clamped beam resonator can be measured by using another resonance mode of the same resonator as a detector. The detector mode and the mode to be detected are coupled through the beam displacement. Displacement of the resonance mode to be measured introduces tension in the beam, which gives rise to an upwards shift in the resonance frequency of the detector mode. We experimentally show that this mechanism can be used to detect the first and second resonance mode of a silicon beam resonator. The modal interaction can also be used to increase the dynamic range of the resonator.
Keywords :
bending; micromechanical resonators; modal analysis; resonance; Si; beam displacement; clamped-clamped beam resonator; detector mode; flexural resonance mode; microresonator; mode mode interaction; motion detection; resonance frequency; silicon beam resonator;
Conference_Titel :
Sensors, 2010 IEEE
Conference_Location :
Kona, HI
Print_ISBN :
978-1-4244-8170-5
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2010.5690734