Title :
On the accuracy of perfectly matched layers using a finite element formulation
Author :
Lyons, M.R. ; Polycarpou, A.C. ; Balanis, C.A.
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
Abstract :
A Perfectly Matched Layer (PML) is applied to a three-dimensional edge-based finite element formulation to calculate the S-parameters of waveguide structures. The PML region is implemented in the finite element code as a non-physical uniaxial anisotropic lossy material. Numerical results demonstrate the accuracy and future potential of such an absorber.
Keywords :
S-parameters; finite element analysis; waveguide theory; S-parameters; absorber; perfectly matched layer; three-dimensional edge-based finite element analysis; uniaxial anisotropic lossy material; waveguide; Anisotropic magnetoresistance; Computer errors; Conducting materials; Finite difference methods; Finite element methods; Perfectly matched layers; Permittivity; Reflection; Tensile stress; Time domain analysis;
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3246-6
DOI :
10.1109/MWSYM.1996.508496
