• DocumentCode
    2139
  • Title

    A Semiblind Digital-Domain Calibration of Pipelined A/D Converters via Convex Optimization

  • Author

    Jintae Kim ; MinJae Lee

  • Author_Institution
    Dept. of Electron. Eng., Konkuk Univ., Seoul, South Korea
  • Volume
    23
  • Issue
    7
  • fYear
    2015
  • fDate
    Jul-15
  • Firstpage
    1375
  • Lastpage
    1379
  • Abstract
    This brief presents a semiblind and foreground calibration method for correcting linear and memoryless errors in pipelined analog-to-digital converters (ADCs). We formulate the calibration problem that finds optimal radices for maximizing signal-to-noise-distortion ratio as a linear fractional programming, a special type of convex optimization problem. The method is further extended to the case when the exact amplitude of a calibration signal is unknown. By utilizing the structure of the calibration signal, it is shown that the optimal radices can be obtained by solving the formulated calibration problem via bisection algorithm. Simulation results indicate that the proposed calibration method can correct linear errors in a hypothetical 14-bit 400 MS/s pipelined ADC using only ≈1600 data samples.
  • Keywords
    analogue-digital conversion; calibration; convex programming; error correction; linear programming; analog-to-digital converters; bisection algorithm; calibration signal; convex optimization problem; foreground calibration method; linear error correction; linear fractional programming; memoryless error correction; optimal radices; pipelined A-D converters; semiblind digital-domain calibration; semiblind method; signal-to-noise-distortion ratio; word length 14 bit; CMOS integrated circuits; Calibration; Convex functions; Noise; Optimization; Semiconductor device modeling; Very large scale integration; Convex optimization; foreground calibration; pipelined analog-to-digital converter (ADC); pipelined analog-to-digital converter (ADC).;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2014.2336472
  • Filename
    6867372