Error-Term Computation for the 15-Term Error-Model preserving Measurement Dynamic

Calibration of vector network analyzers (VNAs) according to the cross-talk including 15-term error-model suffers from a significant reduction in measurement dynamic, if no cross-talk is present. This problem that, to the authors knowledge, has never been addressed before in literature severely restricts the usability of the error-model, especially for on-wafer measurements. It will be shown that the problem is not a numerical one, but rather lies in the propagation of measurement errors during the computation of the error-terms. A novel algorithm, better adapted to the problem at hand, is presented, and suggestions towards an optimum set of calibration standards are given. Finally, wafer- prober measurements that show a significant cross-talk reduction and accuracy gain over 7-term corrections are presented for the first time.