Title :
Low conductor loss microstrip lines with side-grooves
Author :
Li, K. ; Atsuki, K.
Author_Institution :
Univ. of Electro-Commun., Tokyo, Japan
Abstract :
In this paper, we propose two low loss microstrip lines with side-grooves which can weaken the concentration of the current density at the edges of the strip conductor. A method called partial-boundary element method (p-BEM) is employed in our analysis. Theoretical results for these lines demonstrate significant effects on the conductor loss reduction by the side-grooves and inlaid dielectric material.
Keywords :
MMIC; boundary-elements methods; integrated circuit interconnections; losses; microstrip circuits; microstrip lines; MMICs; conductor loss; current density; inlaid dielectric material; microstrip lines; partial-boundary element method; side-grooves; strip conductor; Boundary element methods; Conducting materials; Conductors; Current density; Dielectric losses; Dielectric materials; Dielectric substrates; MMICs; Microstrip; Strips;
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3246-6
DOI :
10.1109/MWSYM.1996.508519
