DocumentCode
2139657
Title
Low Phase Noise 10GHz DRO with low 1/f noise SiGe HBTs
Author
Gruhle, A. ; Mähner, C. ; Weidmann, K.
Author_Institution
Daimler-Benz Research, W. Runge Str.11, D-89081 Ulm, Germany, (49)731-505-2252
Volume
1
fYear
1998
fDate
Oct. 1998
Firstpage
391
Lastpage
394
Abstract
SiGe HBTs are ideal devices for low phase noise microwave oscillators as they combine high cutoff frequencies with low 1/f noise. A hybrid 10GHz dielectric resonator oscillator has been built using discrete SiGe HBT chips. The low frequency noise and the phase noise of the circuit were measured and compared. The value of ¿118 dBc at 10 kHz off carrier was probably the resolution limit of the measurement setup. These silicon-based devices largely outperform III/V HBTs and they offer the additional advantage of much lower costs.
Keywords
Circuit noise; Cutoff frequency; Dielectric measurements; Germanium silicon alloys; Low-frequency noise; Microwave devices; Microwave oscillators; Phase noise; Semiconductor device measurement; Silicon germanium;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1998. 28th European
Conference_Location
Amsterdam, Netherlands
Type
conf
DOI
10.1109/EUMA.1998.338020
Filename
4139107
Link To Document