• DocumentCode
    2139657
  • Title

    Low Phase Noise 10GHz DRO with low 1/f noise SiGe HBTs

  • Author

    Gruhle, A. ; Mähner, C. ; Weidmann, K.

  • Author_Institution
    Daimler-Benz Research, W. Runge Str.11, D-89081 Ulm, Germany, (49)731-505-2252
  • Volume
    1
  • fYear
    1998
  • fDate
    Oct. 1998
  • Firstpage
    391
  • Lastpage
    394
  • Abstract
    SiGe HBTs are ideal devices for low phase noise microwave oscillators as they combine high cutoff frequencies with low 1/f noise. A hybrid 10GHz dielectric resonator oscillator has been built using discrete SiGe HBT chips. The low frequency noise and the phase noise of the circuit were measured and compared. The value of ¿118 dBc at 10 kHz off carrier was probably the resolution limit of the measurement setup. These silicon-based devices largely outperform III/V HBTs and they offer the additional advantage of much lower costs.
  • Keywords
    Circuit noise; Cutoff frequency; Dielectric measurements; Germanium silicon alloys; Low-frequency noise; Microwave devices; Microwave oscillators; Phase noise; Semiconductor device measurement; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1998. 28th European
  • Conference_Location
    Amsterdam, Netherlands
  • Type

    conf

  • DOI
    10.1109/EUMA.1998.338020
  • Filename
    4139107