DocumentCode :
2140889
Title :
A new hybrid symmetrical condensed node for the frequency-domain TLM method
Author :
Chen, S. ; Vahldieck, R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Victoria Univ., BC, Canada
Volume :
2
fYear :
1996
fDate :
17-21 June 1996
Firstpage :
427
Abstract :
This paper presents an new hybrid symmetrical condensed node (SCN) for the frequency-domain TLM (FDTLM) method. The scattering matrix of the new node is developed by taking advantage of a new port numbering scheme introduced for the time-domain node and a shunt decomposition technique to determine the propagation constant and characteristic admittances on the node link lines. The characteristics of the new frequency-domain node are described by a symmetric symbolic scattering matrix. The symmetry of the matrix allows significant savings in computer memory. For lossless media the scattering matrix becomes Hermitian. A dispersion analysis shows that the new node exhibits a much smaller wave propagation error than other FDTLM nodes. To test the new node, eigenvalues and scattering parameters for microstrip lines and discontinuities are computed and compared with well established results from measurements and other numerical methods.
Keywords :
Hermitian matrices; S-matrix theory; S-parameters; eigenvalues and eigenfunctions; electromagnetic wave scattering; frequency-domain analysis; matrix decomposition; microstrip discontinuities; microstrip lines; transmission line matrix methods; Hermitian matrix; characteristic admittances; dispersion analysis; eigenvalues; frequency-domain TLM method; hybrid symmetrical condensed node; lossless media; matrix symmetry; microstrip discontinuities; microstrip lines; node link lines; port numbering scheme; propagation constant; scattering matrix; scattering parameters; shunt decomposition technique; symmetric symbolic scattering matrix; wave propagation error; Computer errors; Eigenvalues and eigenfunctions; Frequency domain analysis; Matrix decomposition; Propagation constant; Scattering; Symmetric matrices; Testing; Time domain analysis; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1996., IEEE MTT-S International
Conference_Location :
San Francisco, CA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-3246-6
Type :
conf
DOI :
10.1109/MWSYM.1996.508759
Filename :
508759
Link To Document :
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