DocumentCode
2141920
Title
Runtime verification of nonlinear analog circuits using incremental Time-augmented RRT algorithm
Author
Ahmadyan, Seyed Nematollah ; Kumar, Jayanand Asok ; Vasudevan, Shobha
Author_Institution
Coordinated Science Lab, Electrical and Computer Engineerning Department, University of Illinois at Urbana-Champaign, USA
fYear
2013
fDate
18-22 March 2013
Firstpage
21
Lastpage
26
Abstract
Because of complexity of analog circuits, their verification presents many challenges. We propose a runtime verification algorithm to verify design properties of nonlinear analog circuits. Our algorithm is based on performing exploratory simulations in the state-time space using the Time-augmented Rapidly Exploring Random Tree (TRRT) algorithm. The proposed runtime verification methodology consists of i) incremental construction of the TRRT to explore the state-time space and ii) use of an incremental online monitoring algorithm to check whether or not the incremented TRRT satisfies or violates specification properties at each iteration. In comparison to the Monte Carlo simulations, for providing the same state-space coverage, we utilize a logarithmic order of memory and time.
Keywords
Algorithm design and analysis; Analog circuits; Integrated circuit modeling; Monitoring; Monte Carlo methods; Phase locked loops; Runtime;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location
Grenoble, France
ISSN
1530-1591
Print_ISBN
978-1-4673-5071-6
Type
conf
DOI
10.7873/DATE.2013.019
Filename
6513465
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