• DocumentCode
    2141920
  • Title

    Runtime verification of nonlinear analog circuits using incremental Time-augmented RRT algorithm

  • Author

    Ahmadyan, Seyed Nematollah ; Kumar, Jayanand Asok ; Vasudevan, Shobha

  • Author_Institution
    Coordinated Science Lab, Electrical and Computer Engineerning Department, University of Illinois at Urbana-Champaign, USA
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    21
  • Lastpage
    26
  • Abstract
    Because of complexity of analog circuits, their verification presents many challenges. We propose a runtime verification algorithm to verify design properties of nonlinear analog circuits. Our algorithm is based on performing exploratory simulations in the state-time space using the Time-augmented Rapidly Exploring Random Tree (TRRT) algorithm. The proposed runtime verification methodology consists of i) incremental construction of the TRRT to explore the state-time space and ii) use of an incremental online monitoring algorithm to check whether or not the incremented TRRT satisfies or violates specification properties at each iteration. In comparison to the Monte Carlo simulations, for providing the same state-space coverage, we utilize a logarithmic order of memory and time.
  • Keywords
    Algorithm design and analysis; Analog circuits; Integrated circuit modeling; Monitoring; Monte Carlo methods; Phase locked loops; Runtime;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.019
  • Filename
    6513465