• DocumentCode
    2142011
  • Title

    Sentiment and affect analysis of Dark Web forums: Measuring radicalization on the internet

  • Author

    Chen, Hsinchun

  • Author_Institution
    Dept. of Manage. Inf. Syst., Univ. of Arizona, Tucson, AZ
  • fYear
    2008
  • fDate
    17-20 June 2008
  • Firstpage
    104
  • Lastpage
    109
  • Abstract
    Dark Web forums are heavily used by extremist and terrorist groups for communication, recruiting, ideology sharing, and radicalization. These forums often have relevance to the Iraqi insurgency or Al-Qaeda and are of interest to security and intelligence organizations. This paper presents an automated approach to sentiment and affect analysis of selected radical international Ahadist Dark Web forums. The approach incorporates a rich textual feature representation and machine learning techniques to identify and measure the sentiment polarities and affect intensities expressed in forum communications. The results of sentiment and affect analysis performed on two large-scale Dark Web forums are presented, offering insight into the communities and participants.
  • Keywords
    Internet; information services; learning (artificial intelligence); terrorism; Al-Qaeda; Internet; Iraqi insurgency; affect analysis; intelligence organizations; machine learning techniques; radical international Jihadist Dark Web forums; radicalization; sentiment analysis; terrorist groups; textual feature representation; Artificial intelligence; Discussion forums; Information analysis; Information security; Machine learning; Recruitment; Social network services; Statistical analysis; Statistical distributions; Uniform resource locators; affect analysis; dark web forums; sentiment analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligence and Security Informatics, 2008. ISI 2008. IEEE International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-2414-6
  • Electronic_ISBN
    978-1-4244-2415-3
  • Type

    conf

  • DOI
    10.1109/ISI.2008.4565038
  • Filename
    4565038