DocumentCode :
2143833
Title :
Magnetic near-field distribution measurements over finite meander circuit patterns by fiber-optic magneto-optic probe
Author :
Iwanami, M. ; Hoshino, Shigeki ; Kishi, Masato ; Tsuchiya, Masahiro
Author_Institution :
Assoc. of Super-Adv. Electron. Technol., Tsukuba, Japan
Volume :
1
fYear :
2003
fDate :
18-22 Aug. 2003
Firstpage :
347
Abstract :
For an optimum design of today´s fine, complicated SLIs and PCBs, it is considered indispensable to apply electromagnetic near-field probing technique with low-invasiveness and high-spatial resolution. In this study, we have evaluated spatial resolutions and measurable bandwidths of the fiber-edge magneto-optic (FEMO) probes with a MO crystal of an around 10 μm thickness. We fabricated two kinds of probes that utilize the Faraday effects caused by a domain wall displacement phenomenon and that by a rotation magnetization (RM) phenomenon, respectively. It turned out that the RM-based probe could distinguish a magnetic field generated from each line of a 10 μm-scale meander circuit and had measurable bandwidth of around 2.5 GHz. Furthermore, by applying the RM-based probe, magnetic near-field mappings over finite circuits were realized in the GHz range. We confirmed the validness of those by the simulations using an electromagnetic field simulator.
Keywords :
circuit simulation; electromagnetic fields; magnetic field measurement; magneto-optical sensors; near-field scanning optical microscopy; FEMO probes; Faraday effects; MO crystal; RM-based probe; domain wall displacement phenomenon; electromagnetic field simulation; electromagnetic near-field probing; fiber-edge magneto-optic probes; finite circuits; finite meander circuit patterns; magnetic near-field distribution; magnetic near-field mappings; measurable bandwidths; rotation magnetization phenomenon; spatial resolutions; Bandwidth; Circuit simulation; Electromagnetic measurements; Magnetic circuits; Magnetic domain walls; Magnetic field measurement; Magnetooptic effects; Probes; Spatial resolution; Thickness measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2003 IEEE International Symposium on
Print_ISBN :
0-7803-7835-0
Type :
conf
DOI :
10.1109/ISEMC.2003.1236619
Filename :
1236619
Link To Document :
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