DocumentCode :
2144437
Title :
Pathloss predictions from microcell to macrocell
Author :
Lee, William C Y ; Lee, David J Y
Author_Institution :
Vodafone AirTouch Global Technol., Walnut Creek, CA, USA
Volume :
3
fYear :
2000
fDate :
2000
Firstpage :
1988
Abstract :
The use of microcells to increase the capacity of cellular mobile communication especially in dense urban areas is an attractive tactic. A number of experimental and theoretical studies have been undertaken regarding propagation in urban microcellular systems. However, predicting the local mean of these microcells requires building data in a 2D or 3D format. Usually, the more detailed the data, the higher the cost and more accurate the model. How to balance the cost and resolution of building data with the accuracy of the model is always a challenging task. A proposed microcell prediction model is necessary to determine the pathloss statistical properties of the cell site based on multiple break points. This model has been validated with the measured data from drive tests performed in various countries/cities, with differing transmitter heights, unique frequencies, and separate cell site parameters and different kinds of mobile environment. The initial findings are that this empirical and theoretical based microcell model performed well in all areas with varying conditions. Secondly, this model can be further reinforced based on the collected measured data. This paper addresses how this model works and also provides the outputs on validation of this model
Keywords :
UHF radio propagation; cellular radio; microcellular radio; building data; cellular mobile communication; dense urban areas; macrocellular radio; microcell prediction model; microcellular radio; path loss predictions; statistical properties; Cities and towns; Costs; Frequency measurement; Macrocell networks; Microcell networks; Mobile communication; Performance evaluation; Predictive models; Testing; Urban areas;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Technology Conference Proceedings, 2000. VTC 2000-Spring Tokyo. 2000 IEEE 51st
Conference_Location :
Tokyo
ISSN :
1090-3038
Print_ISBN :
0-7803-5718-3
Type :
conf
DOI :
10.1109/VETECS.2000.851620
Filename :
851620
Link To Document :
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